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1

Laser-assisted deposition of optical coatings

P. Thomsen-Schmidt, D. Schäfer, B. Steiger, H. Brauße, H. Johansen, T. Martini

Journal:

Thin Solid Films

Year:

1994

Language:

english

File:

PDF, 484 KB

english, 1994

2

Reconstructing surface profiles from curvature measurements

Clemens Elster, Joachim Gerhardt, Peter Thomsen-Schmidt, Michael Schulz, Ingolf Weingärtner

Journal:

Optik - International Journal for Light and Electron Optics

Year:

2002

Language:

english

File:

PDF, 119 KB

english, 2002

3

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Devices and Diagnostics in Materials Science - Facility for the curvature-based measurement of the nanotopography of complex surfaces

Thomsen-Schmidt, Peter, Schulz, Michael, Weingaertner, Ingolf, Andrews, David L., Asakura, Toshimitsu, Jutamulia, Suganda, Kirk, Wiley P., Lagally, Max G., Lal, Ravindra B., Trolinger, James D.

Year:

2000

Language:

english

File:

PDF, 1.09 MB

english, 2000

4

Laser-induced multiple phase transitions in GeTe films traced by time-resolved TEM

O. Bostanjoglo, P. Thomsen-Schmidt

Journal:

Applied Surface Science

Year:

1989

Language:

english

File:

PDF, 677 KB

english, 1989

5

Time-resolved TEM of laser-induced structural changes in GeTe films

O. Bostanjoglo, P. Thomsen-Schmidt

Journal:

Applied Surface Science

Year:

1990

Language:

english

File:

PDF, 755 KB

english, 1990

6

Laser-induced nucleation of crystals in amorphous Ge films

O. Bostanjoglo, W. Marine, P. Thomsen-Schmidt

Journal:

Applied Surface Science

Year:

1992

Language:

english

File:

PDF, 773 KB

english, 1992

7

Laser induced plasma formation by picosecond pulse irradiation

W. Marine, M. Gerri, P. Thomsen-Schmidt, J.M. Scotto d'Aniello

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 695 KB

english, 1993

8

Thickness determination for SiO2 films on Si by X-ray reflectometry at the Si K edge

M Krumrey, M Hoffmann, G Ulm, K Hasche, P Thomsen-Schmidt

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 138 KB

english, 2004

9

Characterization and Deposition of Oxide Films by Laser Assisted Electron Beam Evaporation (LEBE) for Optical Applications

P. Thomsen-Schmidt, D. Schäfer, H. Johansen, T. Martini, G. Pfeifer, G. Reisse, H. Schwiecker, R. Wolf, U. Schneider, J. Zilian

Journal:

physica status solidi (a)

Year:

1994

Language:

english

File:

PDF, 514 KB

english, 1994

10

Realisation and metrological characterisation of thickness standards below 100

P. Thomsen-Schmidt, K. Hasche, G. Ulm, K. Herrmann, M. Krumrey, G. Ade, J. Stümpel, I. Busch, S. Schädlich, A. Schindler, W. Frank, D. Hirsch, M. Procop, U. Beck

Journal:

Applied Physics A: Materials Science & Processing

Year:

2004

Language:

english

File:

PDF, 206 KB

english, 2004

11

Zero phonon lines of the M-center in ZnS crystals

Axel Hoffmann, Immanuel Broser, Peter Thomsen-Schmidt

Journal:

Journal of Luminescence

Year:

1988

Language:

english

File:

PDF, 123 KB

english, 1988

12

SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Surface Scattering and Diffraction III - Deducing light scatter from AFM measurements

Hahlweg, Cornelius, Rinder, Thomas, Thomsen-Schmidt, Peter, Groh, C., Rothe, Hendrik, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2003

Language:

english

File:

PDF, 501 KB

english, 2003

13

SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications

Hasche, Klaus, Thomsen-Schmidt, Peter, Krumrey, Michael, Ade, George, Ulm, Gerhard, Stuempel, Juergen, Schaedlich, Stefan, Frank, Wilfried, Procop, Mathias, Beck, Uwe, Decker, Jennifer E., Brown, Nich

Year:

2003

Language:

english

File:

PDF, 375 KB

english, 2003

14

The determination of the atomic mass constant with ion accumulation: status and perspectives

Schlegel, C, Gläser, M, Scholz, F, Mecke, M, Kiekenap, G, Thomsen-Schmidt, P, Hoffmann, K P, Ahbe, T

Journal:

Year:

2010

Language:

english

File:

PDF, 1.12 MB

english, 2010

15

Characterization of a traceable profiler instrument for areal roughness measurement

Thomsen-Schmidt, P

Journal:

Measurement Science and Technology

Year:

2011

Language:

english

File:

PDF, 2.44 MB

english, 2011

16

SPIE Proceedings [SPIE 1994 International Symposium on Optical Interference Coatings - Grenoble, France (Sunday 5 June 1994)] Optical Interference Coatings - Single and multilayer coatings deposited by laser-assisted electron beam evaporation

Schaefer, Dieter, Thomsen-Schmidt, Peter, Johansen, H., Martini, T., Steiger, Bernhard, Pfeifer, G., Reisse, Guenter, Abeles, Florin

Year:

1994

Language:

english

File:

PDF, 510 KB

english, 1994

17

SPIE Proceedings [SPIE 1994 International Symposium on Optical Interference Coatings - Grenoble, France (Sunday 5 June 1994)] Optical Interference Coatings - Influence of preparation conditions on the laser damage threshold of oxide thin films at 248 nm measured by photoacoustic mirage detection

Reichling, Michael, Siegel, J., Matthias, Eckart, Schaefer, Dieter, Thomsen-Schmidt, Peter, Abeles, Florin

Year:

1994

Language:

english

File:

PDF, 283 KB

english, 1994

18

SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1995 - Boulder, CO (Monday 30 October 1995)] 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995 - UV-laser investigation of dielectric thin films

Ettrich, K., Blaschke, Holger, Welsch, Eberhard, Thomsen-Schmidt, Peter, Schaefer, Dieter, Bennett, Harold E., Guenther, Arthur H., Kozlowski, Mark R., Newnam, Brian E., Soileau, M. J.

Year:

1996

Language:

english

File:

PDF, 561 KB

english, 1996

19

Procedure to approximately estimate the uncertainty of material ratio parameters due to inhomogeneity of surface roughness

Hüser, Dorothee, Hüser, Jonathan, Rief, Sebastian, Seewig, Jörg, Thomsen-Schmidt, Peter

Journal:

Measurement Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.22 MB

english, 2016

20

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Devices and Diagnostics in Materials Science - Reliable curvature sensor for measuring the topography of complex surfaces

Schulz, Michael, Thomsen-Schmidt, Peter, Weingaertner, Ingolf, Andrews, David L., Asakura, Toshimitsu, Jutamulia, Suganda, Kirk, Wiley P., Lagally, Max G., Lal, Ravindra B., Trolinger, James D.

Year:

2000

Language:

english

File:

PDF, 2.43 MB

english, 2000

21

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II - Measurement of steep aspheres: a step forward to nanometer accuracy

Weingaertner, Ingolf, Schulz, Michael, Thomsen-Schmidt, Peter, Elster, Clemens, Duparre, Angela, Singh, Bhanwar

Year:

2001

Language:

english

File:

PDF, 180 KB

english, 2001

22

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Methods, error influences, and limits for the ultraprecise measurement of slope and figure for large, slightly nonflat, or steep complex surfaces

Weingaertner, Ingolf, Al-Jumaily, Ghanim A., Duparre, Angela, Schulz, Michael, Thomsen-Schmidt, Peter, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.64 MB

english, 2000

23

Uncertainty of Cutting Edge Roughness Estimation Depending on Waviness Filtration

Hüser, Dorothee, Thomsen-Schmidt, Peter, Meeß, Rudolf

Journal:

Year:

2016

Language:

english

File:

PDF, 333 KB

english, 2016